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1

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - G-PUF: An Intrinsic PUF Based on GPU Error Signatures

Forlin, Bruno, Husemann, Ronaldo, Carro, Luigi, Reinbrecht, Cezar, Hamdioui, Said, Taouil, Mottaqiallah

Year:

2020

File:

PDF, 187 KB

2020

2

[IEEE 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Palma de Mallorca, Spain (2017.4.4-2017.4.6)] 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Interconnect networks for resistive computing architectures

Nguyen, H.A. Du, Xie, Lei, Yu, Jintao, Taouil, Mottaqiallah, Hamdioui, Said

Year:

2017

Language:

english

File:

PDF, 2.07 MB

english, 2017

3

Stature is an essential predictor of muscle strength in children

Jean-Yves Hogrel, Valérie Decostre, Corinne Alberti, Aurélie Canal, Gwenn Ollivier, Emilie Josserand, Ilham Taouil, Dominique Simon

Journal:

BMC Musculoskeletal Disorders

Year:

2012

Language:

english

File:

PDF, 371 KB

english, 2012

4

The use of non-cavitating coupling fluids for intensifying sonoelectrochemical processes

Hujjatul Islam, Md, Naidji, Bouzid, Hallez, Loic, Et Taouil, Abdeslam, Hihn, Jean-Yves, Burheim, Odne S., Pollet, Bruno G.

Journal:

Ultrasonics Sonochemistry

Year:

2020

File:

PDF, 1.93 MB

2020

5

The Relationship Between Isokinetic Hamstring To Quadriceps Strength Ratio And A Battery Of Exercise Field Tests In Healthy Women

Sutherland, Chad, Taouil, George, Milne, Kevin J.

Journal:

Medicine & Science in Sports & Exercise

Year:

2020

File:

PDF, 456 KB

2020

6

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

Marinissen, Erik Jan, De Wachter, Bart, Smith, Ken, Kiesewetter, Jorg, Taouil, Mottaqiallah, Hamdioui, Said

Year:

2014

Language:

english

File:

PDF, 2.01 MB

english, 2014

7

Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

Agbo, Innocent, Taouil, Mottaqiallah, Kraak, Daniël, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Raghavan, Praveen, Catthoor, Francky, Dehaene, Wim

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 2.32 MB

english, 2019

8

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - RNN-Based Detection of Fault Attacks on RSA

Koylu, Troya Cagail, Reinbrecht, Cezar Rodolfo Wedig, Hamdioui, Said, Taouil, Mottaqiallah

Year:

2020

File:

PDF, 298 KB

2020

9

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

Medeiros, G.C., Bolzani Poehls, L.M., Taouil, M., Luis Vargas, F., Hamdioui, S.

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 603 KB

english, 2018

10

Impact and mitigation of SRAM read path aging

Agbo, Innocent, Taouil, Mottaqiallah, Kraak, Daniël, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky, Dehaene, Wim

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 1.16 MB

english, 2018

11

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Modeling Static Noise Margin for FinFET based SRAM PUFs

Masoumian, Shayesteh, Selimis, Georgios, Maes, Roel, Schrijen, Geert-Jan, Hamdioui, Said, Taouil, Mottaqiallah

Year:

2020

File:

PDF, 355 KB

2020

12

[IEEE Comput. Soc 16th International Conference on Data Engineering - San Diego, CA, USA (29 Feb.-3 March 2000)] Proceedings of 16th International Conference on Data Engineering (Cat. No.00CB37073) - Mining Bases for Association Rules Using Closed Sets

Taouil, R., Pasquier, N., Bastide, Y., Lakhal, L.

Year:

2000

Language:

english

File:

PDF, 25 KB

english, 2000

13

System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation

Majzoub, Sohaib, Taouil, Mottaqiallah, Hamdioui, Said

Journal:

Journal of Low Power Electronics

Year:

2019

Language:

english

File:

PDF, 1.80 MB

english, 2019

14

[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Methodology for Application-Dependent Degradation Analysis of Memory Timing

Kraak, Daniel, Agbo, Innocent, Taouil, Mottaqiallah, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky

Year:

2019

Language:

english

File:

PDF, 134 KB

english, 2019

15

Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

Agbo, Innocent, Taouil, Mottaqiallah, Kraak, Daniël, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Raghavan, Praveen, Catthoor, Francky, Dehaene, Wim

Journal:

Microelectronics Reliability

Year:

2019

File:

PDF, 2.32 MB

2019

16

Efficient mining of association rules using closed itemset lattices

Nicolas Pasquier, Yves Bastide, Rafik Taouil, Lotfi Lakhal

Journal:

Information Systems

Year:

1999

Language:

english

File:

PDF, 1.72 MB

english, 1999

17

Testing Open Defects in Memristor-Based Memories

Hamdioui, Said, Taouil, Mottaqiallah, Haron, Nor Zaidi

Journal:

IEEE Transactions on Computers

Year:

2015

Language:

english

File:

PDF, 1.10 MB

english, 2015

18

[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Degradation analysis of high performance 14nm FinFET SRAM

Kraak, Daniel, Agbo, Innocent, Taouil, Mottaqiallah, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky

Year:

2018

Language:

english

File:

PDF, 253 KB

english, 2018

19

Sonoelectrochemistry: Both a Tool for Investigating Mechanisms and for Accelerating Processes

Hihn, Jean-Yves, Doche, Marie-Laure, Hallez, Loïc, Taouil, Abdeslam Et, Pollet, Bruno G.

Journal:

Interface magazine

Year:

2018

Language:

english

File:

PDF, 1.55 MB

english, 2018

20

[IEEE 2009 International Conference on Field-Programmable Technology (FPT) - Sydney, Australia (2009.12.9-2009.12.11)] 2009 International Conference on Field-Programmable Technology - The TU Delft sudoku solver on FPGA

van der Bok, Kees, Taouil, Mottaqiallah, Afratis, Panagiotis, Sourdis, Ioannis

Year:

2009

Language:

english

File:

PDF, 107 KB

english, 2009

21

Doping properties of PEDOT films electrosynthesized under high frequency ultrasound irradiation

A. Et Taouil, F. Lallemand, J.Y. Hihn, J.M. Melot, V. Blondeau-Patissier, B. Lakard

Journal:

Ultrasonics Sonochemistry

Year:

2011

Language:

english

File:

PDF, 829 KB

english, 2011

22

Origin of dips and peaks in the absolute fully resolved cross sections for the electron-impact double ionization of He

Lahmam-Bennani, A., Taouil, I., Duguet, A., Lecas, M., Avaldi, L., Berakdar, J.

Journal:

Physical Review A

Year:

1999

Language:

english

File:

PDF, 189 KB

english, 1999

23

[IEEE 2009 International Conference on Field-Programmable Technology (FPT) - Sydney, Australia (2009.12.9-2009.12.11)] 2009 International Conference on Field-Programmable Technology - Reconfigurable sparse/dense matrix-vector multiplier

Kuzmanov, Georgi, Taouil, Mottaqiallah

Year:

2009

Language:

english

File:

PDF, 350 KB

english, 2009

24

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Stacking order impact on overall 3D die-to-wafer Stacked-IC cost

Taouil, Mottaqiallah, Hamdioui, Said

Year:

2011

Language:

english

File:

PDF, 777 KB

english, 2011

25

Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching

Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2015

Language:

english

File:

PDF, 1.06 MB

english, 2015

26

[IEEE 2018 IEEE 5th International Congress on Information Science and Technology (CiSt) - Marrakech, Morocco (2018.10.21-2018.10.27)] 2018 IEEE 5th International Congress on Information Science and Technology (CiSt) - Adaptive Dialogue System for Disabled Learners: Towards a Learning Disabilities Model

Taouil, Mohammed, Begdouri, Ahlame, Majda, Aicha

Year:

2018

Language:

english

File:

PDF, 401 KB

english, 2018

27

Community-coupled microgrids for the implementation of a smart grid in Tunisia

Taouil, Khaled, Jellad, Tarek, Chtourou, Zied

Journal:

International Journal of Energy Technology and Policy

Year:

2014

Language:

english

File:

PDF, 679 KB

english, 2014

28

[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) - Sao Paulo, Brazil (2018.3.12-2018.3.14)] 2018 IEEE 19th Latin-American Test Symposium (LATS) - Ionizing radiation modeling in DRAM transistors

Fieback, Moritz, Taouil, Mottaqiallah, Hamdioui, Said, Rovatti, Marco

Year:

2018

Language:

english

File:

PDF, 284 KB

english, 2018

29

Enhancing PUF Based Challenge–Response Sets by Exploiting Various Background Noise Configurations

Martin, Honorio, Peris-Lopez, Pedro, Natale, Giorgio, Taouil, Mottaqiallah, Hamdioui, Said

Journal:

Year:

2019

Language:

english

File:

PDF, 866 KB

english, 2019

30

A novel taxane, difluorovinyl-ortataxel, effectively overcomes paclitaxel-resistance in breast cancer cells

Rong, Dade, Wang, Changwei, Zhang, Xiaomei, Wei, Yanli, Zhang, Mingming, Liu, Daiyuan, Farhan, Haider, Momen Ali, Saleh Abdul, Liu, Yanbin, Taouil, Adam, Guo, Wanrong, Wang, Yican, Ojima, Iwao, Yang,

Journal:

Year:

2020

File:

PDF, 2.12 MB

2020

31

[IEEE 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Limassol, Cyprus (2020.7.6-2020.7.8)] 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs

Reinbrecht, Cezar, Aljuffri, Abdullah, Hamdioui, Said, Taouil, Mottaqiallah, Forlin, Bruno, Sepulveda, Johanna

Year:

2020

File:

PDF, 862 KB

2020

32

Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost

Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 699 KB

english, 2012

33

[IEEE 2014 5th International Renewable Energy Congress (IREC) - hammamet, Tunisia (2014.3.25-2014.3.27)] 2014 5th International Renewable Energy Congress (IREC) - MgSMA: An enhanced SMA for microgrid energy management

Jellad, Tarek, Taouil, Khaled, Chtourou, Zied

Year:

2014

Language:

english

File:

PDF, 822 KB

english, 2014

34

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

Agbo, Innocent, Taouil, Mottaqiallah, Hamdioui, Said, Cosemans, Stefan, Weckx, Pieter, Raghavan, Praveen, Catthoor, Francky

Year:

2015

Language:

english

File:

PDF, 576 KB

english, 2015

35

Defect and Fault Modeling Framework for STT-MRAM Testing

Wu, Lizhou, Rao, Siddharth, Taouil, Mottaqiallah, Cardoso Medeiros, Guilherme, Fieback, Moritz, Marinissen, Erik Jan, Kar, Gouri Sankar, Hamdioui, Said

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2019

Language:

english

File:

PDF, 8.29 MB

english, 2019

36

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - LiD-CAT: A Lightweight Detector for Cache ATtacks

Reinbrecht, Cezar, Hamdioui, Said, Taouil, Mottaqiallah, Niazmand, Behrad, Ghasempouri, Tara, Raik, Jaan, Sepulveda, Johanna

Year:

2020

File:

PDF, 470 KB

2020

37

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)

Aziza, H., Moreau, M., Fieback, M., Taouil, M., Hamdioui, S.

Journal:

Year:

2020

File:

PDF, 2.15 MB

2020

38

Evidence for the involvement of K+channels and K+-Cl–cotransport in the regulatory volume decrease of newborn rat cardiomyocytes

K. Taouil, P. Hannaert

Journal:

Pflügers Archiv European Journal of Physiology

Year:

1999

Language:

english

File:

PDF, 194 KB

english, 1999

39

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs

Taouil, Mottaqiallah, Hamdioui, Said, Verbree, Jouke, Marinissen, Erik Jan

Year:

2010

Language:

english

File:

PDF, 465 KB

english, 2010

40

(e, 2e) ionization of the 2p orbital of argon

Taouil, llham, Duguet, Alain, Lahmam-Bennani, Azzedine, Lohmann, Birgit, Rasch, Jens, Whelan, Colm T, Walters, H R James

Journal:

Journal of Physics B Atomic Molecular and Optical Physics

Year:

1999

Language:

english

File:

PDF, 127 KB

english, 1999

41

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Test Cost Analysis for 3D Die-to-Wafer Stacking

Taouil, Mottaqiallah, Hamdioui, Said, Beenakker, Kees, Marinissen, Erik Jan

Year:

2010

Language:

english

File:

PDF, 630 KB

english, 2010

42

A molecular receptor selective for zwitterionic alanine

Hernandez Rubio, Omayra, Taouil, Rachid, Muñiz, Francisco Muñoz, Marcos Monleon, Laura, Simon, Luis, Sanz, Francisca, Rodriguez Moran, Joaquin

Journal:

Organic & Biomolecular Chemistry

Year:

2016

Language:

english

File:

PDF, 900 KB

english, 2016

43

[IEEE 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Marrakech, Morocco (2020.4.1-2020.4.3)] 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - eSRAM Reliability: Why is it still not optimally solved?

Kraak, Daniel, Taouil, Mottaqiallah, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky

Year:

2020

File:

PDF, 361 KB

2020

44

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Testing Scouting Logic-Based Computation-in-Memory Architectures

Fieback, Moritz, Nagarajan, Surya, Bishnoi, Rajendra, Tahoori, Mehdi, Taouil, Mottaqiallah, Hamdioui, Said

Year:

2020

File:

PDF, 393 KB

2020

45

Bogolyubov Endomorphisms and Non-Commutative Hyperbolic Functions

Accardi, L., Boukas, A., Lu, Yun-Gang, Taouil, H.

Journal:

Lobachevskii Journal of Mathematics

Year:

2020

File:

PDF, 615 KB

2020

46

Electropolymerization of pyrrole on oxidizable metal under high frequency ultrasound irradiation. Application of focused beam to a selective masking technique

A. Et Taouil, F. Lallemand, L. Hallez, J-Y. Hihn

Journal:

Electrochimica Acta

Year:

2010

Language:

english

File:

PDF, 1.24 MB

english, 2010

47

P24 - L’hyperhomocystéinémie, un facteur de risque de thrombose veineuse. Trois cas d’une même famille

Hamadé, A., Yawovi, K., Obringer, G., Strimbu, C.P., Taouil, Z., Gani, M., Allimant, P., Zeyer, B., Dalcher, G.

Journal:

Journal des Maladies Vasculaires

Year:

2005

Language:

french

File:

PDF, 32 KB

french, 2005

48

[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Athens, Greece (2011.04.6-2011.04.8)] 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - How significant will be the test cost share for 3D die-to-wafer stacked-ICs?

Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan

Year:

2011

Language:

english

File:

PDF, 310 KB

english, 2011

49

[IEEE 2013 IEEE International 3D Systems Integration Conference (3DIC) - San Francisco, CA, USA (2013.10.2-2013.10.4)] 2013 IEEE International 3D Systems Integration Conference (3DIC) - Using 3D-COSTAR for 2.5D test cost optimization

Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan, Bhawmik, Sudipta

Year:

2013

Language:

english

File:

PDF, 514 KB

english, 2013

50

Enhanced packet loss recovery for real time PC-based GigE vision AVI systems

Taouil, Khaled, Jellad, Tarek, Chtourou, Zied

Journal:

International Journal of Communication Networks and Distributed Systems

Year:

2015

Language:

english

File:

PDF, 1.82 MB

english, 2015

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